- Past Issues
- e-Submission
-
2021 Impact Factor 1.766
5-Year Impact Factor 1.674
Editorial Office
- +82-2-563-0935
- +82-2-558-2230
- submission@kssse.or.kr
- https://www.kssse.or.kr/
2021 Impact Factor 1.766
5-Year Impact Factor 1.674
KISE Journal of Korean Institute of Surface Engineering 2005;38(4):174-178. Published online: Nov, 30, -0001
Chemical vapor deposition technique has been used to grow epitaxial SiC thin films on Si wafers using tetramethylsilane(TMS) precursor. The films were observed to grow along (110) direction of 3C-SiC at
Keywords Nanocrystalline film;Siiicon carbide;SiC;LPCVD;TMS;