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KISE Journal of Korean Institute of Surface Engineering 2015;48(6):253-259. Published online: Nov, 30, -0001
DOI : 10.5695/JKISE.2015.48.6.253
The test equipment becomes more important with the development of semiconductor industry. MEMS probe is an important testing component to detect the defects from the generated electric signal when it contacts the metal pad of semiconductor devices. Ni-Pd
Keywords Nickel-Palladium Alloy;Electroplating;Hardness;X-ray diffraction;Lattice parameter;Heat treatment;Sheet resistance;