Oct, 31, 2024

Vol.57 No.5

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Review

  • KISE Journal of Korean Institute of Surface Engineering
  • Volume 50(3); 2017
  • Article

Review

KISE Journal of Korean Institute of Surface Engineering 2017;50(3):141-146. Published online: Nov, 30, -0001

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DOI : 10.5695/JKISE.2017.50.3.141

Nanoscopic Understanding of Phase Transition of Epitaxial VO2 Thin Films

  • Kim, Dong-Wook;Sohn, Ahrum;
    Department of Physics, Ewha Womans University;School of Advanced Materials Science & Engineering, Sungkyunkwan University;
Abstract

We investigated configuration of metallic and insulating domains in $VO_2$ thin films, while spanning metal-insulator phase transition. Kelvin probe force microscopy, of which spatial resolution is less than 100 nm, enables us to measure local

Keywords $VO_2$;Phase transition;Work function;Kelvin probe microscopy;Percolation;Structural defects;