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Review
- KISE Journal of Korean Institute of Surface Engineering
- Volume 35(5); 2002
- Article
Review
KISE Journal of Korean Institute of Surface Engineering 2002;35(5):289-294. Published online: Nov, 30, -0001
Crystallinity and Internal Defect Observation of the ZnTe Thin Film Used by Opto-Electronic Sensor Material
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Institute for Advanced Materials Processing, Tohoku University;
Abstract
ZnTe films have been grown on (100) GaAs substrate with two representative problems. The one is lattice mismatch, the other is thermal expansion coefficients mismatch of ZnTe /GaAs. It claims here, the relationship of film thickness and defects distributi
Keywords ZnTe;GaAs;XTEM;HREM;dislocation;