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Review
- KISE Journal of Korean Institute of Surface Engineering
- Volume 35(5); 2002
- Article
Review
KISE Journal of Korean Institute of Surface Engineering 2002;35(5):305-311. Published online: Nov, 30, -0001
Evaluation of the High Purity ZnTe which is an Far-Infrared Sensor Material
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Institute for Advanced materials Processing, Tohoku University;
Abstract
Optical measurements have been used to study the biaxial tensile strain in heteroeptaxial ZnTe epilayers on the (100) GaAs substrate by hot wall epitaxy (HWE) with Zn reservoir. It is effect on the low-temperature photoluminescence spectrum of the materia
Keywords ZnTe;HWE;heteroepitaxy;free exciton;XRD;photoluminescence;